Interfacial Shear Stress between Single-walled Carbon Nanotubes and Substrates

Abstract

A novel technique is developed to make the first ever determination of the shear stress between dielectrophoretically assembled SWNTs and substrates using a combination of modeling and measurements. The measurements are based on simple NEMS cantilever beams, a nanomanipulator, and a scanning electron microscope (SEM). The interfacial shear stress between a small bundle of SWNTs and a gold surface with and without self-assembled monolayers of alkanethiol (2-phenylethanethiol or 2-aminoethanethiol) is determined.