4 Point Probe Manual
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A manually operated 4 Point Probe is a simple apparatus that is used to measure the resistivity of semiconductor samples. By passing a current through two outer probes and measuring the voltage through the inner probes allows the measurement of the substrate resistivity. |
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Anatech SP-100 Plasma System
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Anatech works in the area of gas plasma processing which uses gases present at ambient temperature without thermal phase change. These gases can be either inert or reactive. In the case of reactive gases, processing uses momentum transfer as well as the chemical properties of the gas reaction to modify the material of interest. |
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Brewer Spinner
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The Brewer spinner is a coat and bake combination system. The system can accommodate wafers up to 6” with programmable rpms and bake temperatures. The system combines a precision spin coater with a high uniformity bake plate. |
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Bruker EDS
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Bruker EDS is energy -dispersive spectrometry for the transmission and the scanning transmission electron microscope. Its technique detects x-rays emitted from the sample during bombardment by an electron beam to characterize the elemental composition of the analyzed volume. |
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Carl Zeiss 1540
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Carl Zeiss 1540 cross beam system uses a focus ion beam with gallium metal ion beam source for nanoscale patterning and sculpting. Materials can be milled or deposited while observing the evolution of the surface topography feature of the specimen with ion beam stimulated secondary electrons. Additionally, a highly focused electron column provides the capabilities for high spatial resolution secondary electron imaging as well as backscattered electron imaging for sub-micron depth characterization. The system comes with five gas injector system for ion beam deposition of metals or insulators and for enhanced etching. A resolution of 5nm and 1.1 nm can be achieved with the FIB and SEM columns. The system is also equipped with active vibration isolation and field cancellation system. |
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Carl Zeiss 1540 Cross Beam
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Carl Zeiss 1540 cross beam system uses a focus ion beam with gallium metal ion beam source for nanoscale patterning and sculpting. Materials can be milled or deposited while observing the evolution of the surface topography feature of the specimen with ion beam stimulated secondary electrons. Additionally, a highly focused electron column provides the capabilities for high spatial resolution secondary electron imaging as well as backscattered electron imaging for sub-micron depth characterization. The system comes with five gas injector system for ion beam deposition of metals or insulators and for enhanced etching. A resolution of 5nm and 1.1 nm can be achieved with the FIB and SEM columns. The system is also equipped with active vibration isolation and field cancellation system. |
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Clean room access |
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Dek-tak 3030/3ST
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Dek-tak 3ST measures the vertical profile of samples, thin film thickness, and other topographical features such as film roughness or wafer bowing. The system takes measurements electromechanically by moving a diamond-tipped stylus over the sample surface according to a user-programmed scan length,speed, and stylus force. |
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Dek-tak 3030/3ST (Clean Room only)
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The Dektak 3ST is a 2D contact profilometer used to provide quantitative information about step heights and surface roughness for thin and thick films measurements. This information is collected and analyzed with the Dektak 3ST software on the computer attached to the system. This machine works well with a wide range of materials except for those that are very soft or break under small amounts of stylus force, it has a range of 1-40mg. It provides the following vertical resolution for the given vertical ranges: 1A/65kA, 10A/655kA, 20A/1310kA. It is equipped with a 2.5um stylus that can measure high-aspect ratio features with greater accuracy. The software application calculates and can export the results of user-selected analytical functions for measuring, step height, surface texture, and other parameters to characterize the profile data. |
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E-beam Evaporater
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A physical vapor deposition technique whereby an intense, electron beam is generated from a filament and steered via electric and magnetic fields to strike source material and vaporize it within a vacuum environment.
E-beam evaporator is a custom-built long throw system for achieving very high uniformity
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Electroplating/Lift Off Bench: Bay 3
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Evatec Clusterline Sputtering tool
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Clusterline – 200 tool enables the deposition of Aluminium Nitride (AlN) and Scandium-doped Aluminium Nitride (ScAlN) piezoelectric thin films on 8-inch substrates with great control over crystallinity, stress, stoichiometry and uniformity. |
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EVG 501 Bonder
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The EVG 501 bonder can accommodate small pieces up to 100 mm wafers. It has high vacuum capability bond chamber and can perform the direct bonding, Anodic bonding, thermo-compression bonding. |
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EVG 610 Mask Aligner
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A UV photo lighting tool designed for contact and proximity (up to 1 mm) exposure on up to 100 mm wafers and 5” photomasks. The aligner utilizes a collimated UV LED light source to expose a previously coated photoresist selectively with the aid of a chromium plated photomask. The UV light from the aligner transfers the photomask pattern into the photoresist by altering the solubility of the exposed photoresist. |
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J.C. Nabity system
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The Nabity system turns an SEM into a simple ebeam system. The hardware takes control of the deflection system on the SEM and can then be used to expose patterns in resist. This is particularly useful when there is a need for low energy exposures. The tool is very manual and the calibrations are very primitive. |
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KLA-TENCOR FLX-2320
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A thin-film stress measurement instrument that measures the bow of a wafer caused by the deposition of a stressed thin film. |
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Laurell Spinner
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The Laurell spin processor is used to distribute photoresist in a thin uniform layer by spinning a substrate. The wafer or sample is held in place with a vacuum then the system uses programmable recipes to spin at precise speeds for controlled periods of time. |
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LC Technologies Glove Box
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The LCT glovebox device is a full-size, self-contained glovebox. When connected to RGP-1 series of gas purification systems, it can achieve and sustain a less than 1ppm H2O and O2 inert gas condition. |
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Micro Automation 1006
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A precision machine for cutting semiconductor wafers into individual integrated circuits. With the wafer dicing saw devices or structures out of processed silicon, sapphire, and gallium arsenide wafers, glass materials and other materials can be cut accurately. |
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MIE wire Bonder
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MEI is a wire bonding system that is used to bond chips to holders for quick functionality testing and packaging. The bonding process is based on thermocompression or thermosonic ball bonding using gold wire. The system can handle wire diameters from 17um to 75um and are available with a full line of work holder and options to fit all applications. A digital heat control is present to regulate substrate temperature from ambient to 90°C. |
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Mini Brute Furnace
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The Mini Brute Tube Furnace is a horizontal tube atmospheric furnace system for oxidation, annealing, and alloying that is manually controlled by the user. The user may set a temperature up to 900°C and process pieces up to 6” wafers. This furnace is equipped with a forming gas purge as well as a water bubbler for wet oxidation applications. |
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MRC 8667
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MRC 8667 is an automated cylindrical chamber R&D batch sputtering systems feature horizontal “Sputter Down” mode of sputtering in three target positions, DC magnetron, and RF magnetron mode capabilities at each target position. |
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Nanospec Spectrophotometer
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Nanospec works on the principle that intensity of monochromatic reflected light depends strongly on film thickness. It uses a computer-controlled grating monochromator and a photomultiplier tube detector to measure the reflected optical spectrum. |
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Optiphot 200 Fluorescence MicroScope
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Nikon’s Optiphot is a durable multi-function confocal microscope that enables users to capture detailed images with the HFX camera. Some of the features are: HFX Microflex photomicrography system, CF Optical system, large rectangular, rotating mechanical stage, 50w halogen Kohler lighting. |
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Oxford Plasma Lab System
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The Oxford system is a load-locked inductively coupled plasma etch tool that uses RF (600 watts 13.56MHz) for the RIE water-cooled electrode and 1.2 kW, 2 MHZ on the ICP driven electrode. The system currently uses Chlorine and Boron tri-chloride gases. |
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PANalytical/Philips X’Pert Pro
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The X’Pert 1 X-ray diffractometer from Philips is a powerful instrument for characterizing crystalline materials. It has the potential to conduct a wide variety of measurements and analyses. Furthermore, it is used for determination of stresses in (sub) surface layers and line profile analysis. |
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Parks Scientific XE7 AFMr
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Park XE7 AFM provides accurate topological measurement at highest nanoscale resolution. With its intuitive graphical user interface, and its automated tools, it allows even novice users get from sample placement to scan results, fast. From pre-aligned tip mount to software processing, the XE7 provides highest research productivity in AFM. |
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Perkin Elmer 2400
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The Perkin-Elmer 2400 system is three target magnetron-sputtering system with capability of performing sequential deposition from DC magnetron, RF magnetron and conventional RF cathodes. |
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Phoenix Contact angle measurement
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The Phoenix 150 contact angle measurement provides convenient contact angle measurements for evaluation of surface treatments and cleanliness. It has a special designed optical system of reducing the light scattering and mounting an easy camera. Manual controlled syringe system precisely controls the fluid dispensing. |
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Photo bay
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Pre-diffusion Clean Bench: Bay 1
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Quintel 4000 Mask Aligner
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Quintel 4000 Mask Aligner combines top and bottom side contact lithography printer with the video-view split field microscope used for fine line lithography down to 1 micron or better. It supports substrates up to 150mm diameter |
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Savannah ALD
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A low – to – mid temperature deposition system uses surface bio sorption of single nanoparticles of reactive precursor gases to form single atomic monolayers of a variety of insulating and conductive layers with good uniformity, almost perfect conformity, and minimal substrate heating. |
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SCS Parylene Coating
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The SCS Parylene deposition system can coat Parylene with conformal coatings ranging from a few hundred nanometers to 75 microns in thickness. It can accept chips and wafers up to 6 inches in diameter (12 wafers per process). |
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Sputter Coater
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A high quality Sputter Coater is capable of producing a continuous Pt (platinum) film with a grain size in the order of 2 nm. It is a physical vapor deposition process which is used to apply a very thin, functional coating on a substrate. The process starts by electrically charging a sputtering cathode which in turn forms a plasma causing material to be ejected from the target surface |
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Supra 25 SEM
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The SUPRA 25 SEM uses a unique GEMINI field emission column to achieve excellent nanometer resolution across the entire accelerating voltage range (100eV-30KeV), requiring only minor adjustments throughout the operating voltage range. |
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Thermal Evaporation
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Tousimus Critical Point Dryer
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Tousimus Critical Point Dryer is used to increase yield and uniformity of MEMS devices. Liquid carbon dioxide is the transitional fluid used to process delicate MEMS. |
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ULVAC NLD-570
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This ULVAC system has a tunable neutral network source for uniform etching, as well as low electron temperatures for improved profile control and surface flatness. With an electrostatic chuck and helium back-side cooling, the system provides flexible process chemistry and precise temperature control. |
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Unaxis PlasmaTherm 790
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The PlasmaTherm 790 RIE is a reactive ion etch system with an open load. Photoresist and dielectrics are two applications for this system. Process gases supported by the PlasmaTherm 790 RIE include SF6, CHF3, CF4, O2, and Ar. Wafer sizes up to 200mm can be processed with the PlasmaTherm 790 RIE. |
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Veeco Microtech Ion Mill
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The Veeco NEXUS IBE systems are used for many applications including the process of precisely etching metallic films to create the magnetic sensors used for a wide variety of mobile, automotive, MRAM, and hard disk drive devices. |
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Wet Etch Bench: Bay 2
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Woollam ESM- 300 Ellipsometer
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Ellipsometer is a tool for analyzing thin film structural and optical properties such as thickness, refractive index, multicomponent film segregation, and complex refractive indices. You can use an ellipsometer to measure layers as thin as 1nm and as thick as microns. |
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XACTIX e1
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To etch silicon, XACTIX e1 system uses Xenon difluoride vapor. It’s made to expose samples to cyclic or pulsed xenon difluoride (XeF2) gas. XeF2 can be used to etch Si, Mo, Ge, Nb, polysilicon, Ti, and W isotropically. The same method can be used to create very long undercuts with little or no etch stop, mask, or device layer degradation. |
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Zygo NuView 6000
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Surface roughness, step heights, critical dimensions, and other topographical features can all be measured and characterized with the NuView 6000 optical profiler. All measurements are nondestructive, quick, and do not necessitate the preparation of a sample. |
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Zyvex Nanomanipulator
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The Zyvex NanoWorks is a micro and nanoscale manipulation and testing method that works with a scanning electron microscope (SEM) or a directed ion beam (FIB) device. |
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