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Sang-Joon Cho, Ph.D.

Chief Scientist of R&D, Park SYSTEMS Corporation

Scanning Ion Conductance Microscopy for Single Live Cell Research

Atomic Force Microscopy (AFM) is a powerful measurement technique for nanoscale science and technology. While it is able to provide high-resolution imaging of biological structures below the optical limit and monitoring of biological system dynamics and processes under physiological conditions, certain limitations still exist in the field of bio-applications. In recent times, the development of one class of SPM technique, scanning ion conductance microscopy (SICM), has overcome these limitations and enabled noninvasive, nanoscale investigation of live cells. SICM applications include imaging of cell topography, monitoring of live cell dynamics, mechanical stimulation of live cells, and surface patterning and so forth. Additional findings on the combination of SICM with other SPM techniques as well as patch clamp electrophysiology and optical techniques such as confocal microscopy and fluorescent microscopy can help building integrated knowledge on the structure and function of live cells.

Sponsoring Organization: IGERT Nanomedicine Science and Technology Program

Event Type

Seminar

Departments

COS

 
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