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Synchrotron Spectroscopy:
X-ray Techniques and
Far Infrared Techniques
Prospect of probing an electrochemical interface in situ,
under actual operating conditions, and ability to map both
the substrate (in terms of its electronic and short range
atomic order) as well as the substrate-adsorbate
interactions has tremendous technological implications.
Synchrotron based far infrared and X-ray techniques (X-ray
absorption, and scattering) offer such an opportunity as a
consequence of the unique characteristics of the
synchrotron source.
These include higher: intensity (104 higher), collimation,
polarization, and pulse time structure enabling true in
situ interfacial measurements. While far infrared
spectroscopy is an emerging technique, x-ray absorption
and scattering have recently evolved as a true in situ
probe for electrochemical interface with both model and
commercially relevant nano dispersed materials. The
overall approach is to combine these synchrotron based
X-ray and far infrared spectroscopy, with novel synthesis
methods such as inverse micelle technique for better
design of materials for fuel cell electrocatalysis.
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