Synchrotron Spectroscopy:


X-ray Techniques and Far Infrared Techniques

Prospect of probing an electrochemical interface in situ, under actual operating conditions, and ability to map both the substrate (in terms of its electronic and short range atomic order) as well as the substrate-adsorbate interactions has tremendous technological implications. Synchrotron based far infrared and X-ray techniques (X-ray absorption, and scattering) offer such an opportunity as a consequence of the unique characteristics of the synchrotron source.
These include higher: intensity (104 higher), collimation, polarization, and pulse time structure enabling true in situ interfacial measurements. While far infrared spectroscopy is an emerging technique, x-ray absorption and scattering have recently evolved as a true in situ probe for electrochemical interface with both model and commercially relevant nano dispersed materials. The overall approach is to combine these synchrotron based X-ray and far infrared spectroscopy, with novel synthesis methods such as inverse micelle technique for better design of materials for fuel cell electrocatalysis.


Developed And Maintained By Chandresh Kapadia : Email :