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Author Keyword Title [ Type(Asc)] Year
Filters: First Letter Of Keyword is C and Author is Hamed Tabkhi  [Clear All Filters]
Journal Article
N. Teimouri, H. Tabkhi and G. Schirner, "Alleviating Scalability Limitation of Accelerator-based Platforms", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 1-1, 2018.
Conference Paper
A. Patooghy, H. Tabkhi and M. S.G, "An Efficient Method to Reliable Data Transmission in Network-on-Chips", 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 09/2010.
A. Patooghy, H. Tabkhi and M. S.G, "An Efficient Method to Reliable Data Transmission in Network-on-Chips", 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 09/2010.
A. Patooghy, H. Tabkhi and M. S.G, "An Efficient Method to Reliable Data Transmission in Network-on-Chips", 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 09/2010.
A. Patooghy, H. Tabkhi and M. S.G, "An Efficient Method to Reliable Data Transmission in Network-on-Chips", 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD), 09/2010.
H. Ghasemzadeh-Mohammadi, H. Tabkhi, G. S Miremadi and A. Ejlali, "A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic", ICM International Conference on Microelectronics, 12/2008.
H. Ghasemzadeh-Mohammadi, H. Tabkhi, G. S Miremadi and A. Ejlali, "A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic", ICM International Conference on Microelectronics, 12/2008.
H. Tabkhi, G. S Miremadi and E. A, "An Asymmetric Checkpointing and Rollback Error Recovery Scheme for Embedded Processors", IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 10/2008.
H. Tabkhi, G. S Miremadi and E. A, "An Asymmetric Checkpointing and Rollback Error Recovery Scheme for Embedded Processors", IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems, 10/2008.

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