Next week, March 14th - 18th, Prof. Schirner will be away in Dresden, Germany to attend Design, Automation, and Test Conference in Europe (DATE 2016). He will talk about the paper "Improving Scalability of CMPs with Dense ACCs Coverage" [1].

References

1. N. Teimouri, H. Tabkhi and G. Schirner, Improving Scalability of CMPs with Dense ACCs Coverage, Dresden, Germany, 2016
   
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