X-Ray Diffraction Imaging
X-ray diffraction imaging has been proposed for materials characterization in explosive detection since early in the 1980s. There are commercial X-ray diffraction systems, such as the Morpho XRD 3500, which generate X-ray diffraction images. However, these images use only a small fraction of the diffracted radiation, and thus require long collection times to obtain sufficient signal strength, making them impractical for full luggage inspection. In an effort to gain faster scan time and better signal-to-noise ratio novel architectures have been proposed recently that use clever illumination schemes coupled with advanced localization and image reconstruction algorithms. Our project seeks to develop novel image formation algorithms for these advanced architectures, to extract maximal information and establish that sufficient signal strength is available to perform reliable classification with practical illumination times. The project also seeks to characterize the relative performance of different architectures, as well as the requirements of different architectures for fusion with conventional CT imaging.