Algorithms and Architectures for X-Ray Diffraction Imaging
R4-C2

Develop architectures and algorithms for X-ray diffraction imaging for material identification in luggage

  • Image coherent scatter cross section at each voxel from external projective measurements
  • Characterize achievable performance for different architectures
  • Develop practical algorithms for next generation systems

Relevance to the Homeland Security Enterprise

  • Current CT technology can benefit from added signatures to detect reliably broader classes of materials
  • Vendors are looking at X-ray diffraction as a valuable modality for enhanced material discrimination
  • Technology appropriate for checked and hand-carried luggage inspection
Project Leader
  • David Castañón
    Professor
    Boston University
    Email

  • W. Clem Karl
    Professor
    Boston University
    Email

Students Currently Involved in Project
  • Ke Chen
    Boston University